In an effort to gain a better understanding of Scanning Electron Microscopy, I have recently begun to use a new technique to investigate the organization and functionality of the diverse parts of my experimental model. I am currently looking to expand this work by collaborating with other labs who have the facilities and prior experience to investigate this project further.


Building upon work done by a former lab colleague, I have developed a powerful tool for use in the identification and characterization of the processes in my model system. A major advantage of this development is its improved sensitivity, which allows it to detect subtle dynamic property changes in response to my experimental setup.